Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques; John Wiley & Sons Limited

Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.

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